• DocumentCode
    2533510
  • Title

    Development of a TLM to investigate the effect of a resistive interface in digital flat panel x-ray detectors

  • Author

    Segui, J.A. ; Zhao, W.

  • Author_Institution
    State Univ. of New York, Stony Brook
  • fYear
    2007
  • fDate
    10-11 March 2007
  • Firstpage
    88
  • Lastpage
    89
  • Abstract
    Noxel flat panel X-ray detector (FPD) technologies are currently under development for advanced medical imaging applications. A typical detector consists of a method to detect X-rays, convert absorbed X-ray energy to charge, and perform readout of charge. New designs are increasingly complex and often require additional materials to enhance charge transport or structural properties of the detector. A resistive interface layer (RIL) may be used to perform any of these functional roles and its impact on FPD performance was investigated. In this work, we developed a transmission line model (TLM) to investigate the effect of RIL thickness and resistivity on charge transport and image quality of a FPD.
  • Keywords
    X-ray detection; diagnostic radiography; TLM; X-ray detection; X-ray energy conversion; charge transport; digital flat panel X-ray detectors; medical imaging; resistive interface layer; transmission line model; Conductivity; Electrodes; Photoconducting materials; Photoconductivity; Power transmission lines; Radiography; Resistors; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioengineering Conference, 2007. NEBC '07. IEEE 33rd Annual Northeast
  • Conference_Location
    Long Island, NY
  • Print_ISBN
    978-1-4244-1033-0
  • Electronic_ISBN
    978-1-4244-1033-0
  • Type

    conf

  • DOI
    10.1109/NEBC.2007.4413292
  • Filename
    4413292