DocumentCode
2533510
Title
Development of a TLM to investigate the effect of a resistive interface in digital flat panel x-ray detectors
Author
Segui, J.A. ; Zhao, W.
Author_Institution
State Univ. of New York, Stony Brook
fYear
2007
fDate
10-11 March 2007
Firstpage
88
Lastpage
89
Abstract
Noxel flat panel X-ray detector (FPD) technologies are currently under development for advanced medical imaging applications. A typical detector consists of a method to detect X-rays, convert absorbed X-ray energy to charge, and perform readout of charge. New designs are increasingly complex and often require additional materials to enhance charge transport or structural properties of the detector. A resistive interface layer (RIL) may be used to perform any of these functional roles and its impact on FPD performance was investigated. In this work, we developed a transmission line model (TLM) to investigate the effect of RIL thickness and resistivity on charge transport and image quality of a FPD.
Keywords
X-ray detection; diagnostic radiography; TLM; X-ray detection; X-ray energy conversion; charge transport; digital flat panel X-ray detectors; medical imaging; resistive interface layer; transmission line model; Conductivity; Electrodes; Photoconducting materials; Photoconductivity; Power transmission lines; Radiography; Resistors; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioengineering Conference, 2007. NEBC '07. IEEE 33rd Annual Northeast
Conference_Location
Long Island, NY
Print_ISBN
978-1-4244-1033-0
Electronic_ISBN
978-1-4244-1033-0
Type
conf
DOI
10.1109/NEBC.2007.4413292
Filename
4413292
Link To Document