Title :
An asymmetrical fault line selection based on I2 scalar product research in distribution system with DGs
Author :
Lu, Yuping ; Du, Jiao ; Lin, Xia ; Ma, Jinjie
Author_Institution :
Sch. of Electr., Eng., Southeast Univ., Nanjing
Abstract :
The introduction of DG in distribution system has many negative impacts on conventional protection. Typically it will deteriorate selectivity and sensitivity of existing relay. It will change a simple radiation distribution system with single source into a complex multi-source system. To make the nowadays broadly used protection scheme and their coordination meet the great challenge, this paper proposed a novel fault line selection approach based on negative sequence current (I2) scalar product (I2SP) to locate fault line in a DG system. Negative sequence current has a powerful ability of fault identification. I2SP can effectively decide direction of fault location without voltages. It will help to develop a wide-area protection scheme in DG system. It can easily eliminate relay mal-operation and simplify relay scheme in distribution system because of introduction of renewable energy sources. The simulation results proved its effectiveness and practicability of the method.
Keywords :
distributed power generation; fault location; power generation protection; relay protection; I2 scalar product research; asymmetrical fault line selection; distributed generation; fault identification; fault location; negative sequence current scalar product; radiation distribution system; renewable energy sources; wide-area protection scheme; Adaptive control; Circuit faults; Fault diagnosis; Power generation; Power supplies; Power system protection; Power system relaying; Programmable control; Protective relaying; Substation protection; Asymmetrical fault analyses; Distributed generation (DG); faulty line selection; negative sequence current; protection mal-operation; scalar product;
Conference_Titel :
Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-1-4244-1905-0
Electronic_ISBN :
1932-5517
DOI :
10.1109/PES.2008.4596209