• DocumentCode
    2533799
  • Title

    A view of the AI-ESTATE architecture and the ABBET(TM) upper layers

  • Author

    Simpson, William R.

  • Author_Institution
    IDA, Alexandria, VA, USA
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    213
  • Lastpage
    217
  • Abstract
    Work in the IEEE Standards Coordinating Committee 20 (SCC20) to develop standards for A Broad Based Environment for Test (ABBET) and for supporting intelligent diagnostics in test environments (AI-ESTATE) is coming to fruition. The ABBET subcommittee is preparing to ballot the “full-use” version of its architecture standard (P1226), and the AI-ESTATE subcommittee has published its architecture standard in “trial-use” form (P-1232). Although independent of the ABBET architecture, many view AI-ESTATE as an integral part of the ABBET family. In this paper, the author discusses the elements of AI-ESTATE as they might fit within the AI-ESTATE framework. He also discusses how a “systems view” to developing test environments facilitates this integration
  • Keywords
    IEEE standards; artificial intelligence; automatic test software; programming environments; software standards; ABBET; AI-ESTATE architecture; IEEE Standards Coordinating Committee 20; P-1232; P1226; SCC20; architecture standard; intelligent diagnostics; test environments; Artificial intelligence; Automatic testing; Electronic equipment testing; Life testing; Software standards; Software testing; Standards Coordinating Committees; Standards development; Standards publication; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
  • Conference_Location
    Dayton, OH
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-3379-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1996.547699
  • Filename
    547699
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2533799