DocumentCode :
2533932
Title :
Timing-constrained yield-driven wire sizing for critical area minimization
Author :
Yan, Jin-Tai ; Chiang, Bo-Yi ; Lee, Chia-Fang
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsinchu
fYear :
2006
fDate :
21-24 May 2006
Abstract :
In this paper, given a rectilinear Steiner tree (RST) with a source and a set of sinks, it is assumed that any sink in the RST has its timing constraint. Based on the concept of timing-consistent wire widening for any wire segment, the width of any wire segment may be replaced with its timing-consistent width without destroying the timing constraint of any sink. Furthermore, according to a given particle defect size, the widths of all the wire segments are reassigned to minimize total critical area of the RST by running a timing-constrained wire sizing process. The experimental results show that our proposed timing-constrained yield-driven wire sizing (TYWS) approach increase about 50% routing area to reduce 80%~90% critical area for the tested routing nets
Keywords :
circuit layout; circuit optimisation; minimisation; trees (mathematics); wiring; critical area minimization; rectilinear Steiner tree; timing-constrained yield-driven wire sizing; wire widening; Clocks; Computer science; Delay; Joining processes; Routing; Steiner trees; Testing; Timing; Topology; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
Type :
conf
DOI :
10.1109/ISCAS.2006.1692785
Filename :
1692785
Link To Document :
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