Title :
Nanomanipulation with 3D visual and force feedback using atomic force microscopes
Author :
Vogl, Wolfgang ; Sitti, Metin ; Zah, M.F.
Author_Institution :
Technische Univ. Munchen, Garching, Germany
Abstract :
Atomic force microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.
Keywords :
atomic force microscopy; augmented reality; computational geometry; deformation; digital simulation; force feedback; force sensors; haptic interfaces; manipulators; nanotechnology; splines (mathematics); 3D force feedback; 3D visual feedback; AFM probe; atomic force microscopy; augmented reality; collision detection algorithm; force information sensing; nanomanipulation interfaces; nanoscale 3D topography; real time simulation; spline-based geometry model; surface deformation; surface modeling; Atomic force microscopy; Deformable models; Force feedback; Force measurement; High-resolution imaging; Manipulators; Solid modeling; Spline; Surface topography; User interfaces;
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
DOI :
10.1109/NANO.2004.1392347