DocumentCode
2534161
Title
Nanomanipulation with 3D visual and force feedback using atomic force microscopes
Author
Vogl, Wolfgang ; Sitti, Metin ; Zah, M.F.
Author_Institution
Technische Univ. Munchen, Garching, Germany
fYear
2004
fDate
16-19 Aug. 2004
Firstpage
349
Lastpage
351
Abstract
Atomic force microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.
Keywords
atomic force microscopy; augmented reality; computational geometry; deformation; digital simulation; force feedback; force sensors; haptic interfaces; manipulators; nanotechnology; splines (mathematics); 3D force feedback; 3D visual feedback; AFM probe; atomic force microscopy; augmented reality; collision detection algorithm; force information sensing; nanomanipulation interfaces; nanoscale 3D topography; real time simulation; spline-based geometry model; surface deformation; surface modeling; Atomic force microscopy; Deformable models; Force feedback; Force measurement; High-resolution imaging; Manipulators; Solid modeling; Spline; Surface topography; User interfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN
0-7803-8536-5
Type
conf
DOI
10.1109/NANO.2004.1392347
Filename
1392347
Link To Document