DocumentCode :
2534333
Title :
An electrically-excited acoustic emission test technique for screening multilayer ceramic capacitors
Author :
Chan, Ning-Huat ; Rawal, Bharat S.
Author_Institution :
AVX Corp., Myrtle Beach, SC, USA
fYear :
1988
fDate :
9-11 May 1988
Firstpage :
502
Lastpage :
506
Abstract :
An AC-voltage-induced acoustic emission test technique for screening physical flaws, particularly delaminations, in various Z5U and X7R/BX ceramic capacitors was extensively evaluated. The test results showed that the severity of delaminations strongly coincided with the corresponding degree of severity in the acoustic signal. This led to a ten-times-higher rejection rate against the ceramic capacitors with delaminations in most of the screening tests. The source of acoustic waves was attributed to the partial discharge in delaminations, cracks, and pores due to the field intensification by the high-K dielectric materials. Almost identical patterns of behavior were found for acoustic emission and partial discharge with respect to the application of voltage and the chance of dielectric material
Keywords :
acoustic emission testing; capacitors; ceramics; electron device testing; 300 Hz; 60 Hz; AC-voltage-induced acoustic emission test technique; X7R/BX ceramic capacitors; Z5U multilayer ceramic capacitor; acoustic waves; cracks; delaminations; dielectric material; field intensification; partial discharge; physical flaws; screening tests; Acoustic emission; Acoustic signal detection; Acoustic testing; Acoustic waves; Capacitors; Ceramics; Delamination; Nonhomogeneous media; Thermal stresses; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ECC.1988.12639
Filename :
12639
Link To Document :
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