Does the burn-in of integrated circuits continue to be a meaningful course to pursue

The mechanisms that control failure rate in early life are discussed, and the probable success of removing latent defects via burn-in or other means is analyzed using typical data. The analysis utilizes a first-order model of the instantaneous failure rate during early life and shows whether burn-in is appropriate or necessary for the product, and if so, what the duration of such burn-in should be. An understanding of the mechanisms which control latent defects (together with the likelihood of such latent defects causing failure) leads to the conclusion that a fully electronic product, which is designed with adequate operating margins, manufactured without defect, and always operated within its rated limits will never fail.<>