DocumentCode :
2534591
Title :
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Author :
Perrouin, Gilles ; Sen, Sagar ; Klein, Jacques ; Baudry, Benoit ; Le Traon, Yves
Author_Institution :
LASSY, Univ. of Luxembourg, Luxembourg City, Luxembourg
fYear :
2010
fDate :
6-10 April 2010
Firstpage :
459
Lastpage :
468
Abstract :
Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPL models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed “all-at-once´”. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on Aspect OPTIMA, a concrete transactional SPL.
Keywords :
program testing; Alloy; Aspect OPTIMA; SAT solvers; SPL models; T feature interactions; T-wise criteria; automated T-wise test case generation; combinatorial explosion; exhaustive testing; scalable T-wise test case generation; software product lines; Automatic testing; Combinatorial mathematics; Concrete; Costs; Encoding; Explosions; Product safety; Software safety; Software testing; Software tools; Alloy; Model-based Engineering and Testing; Software Product Lines; T-wise and pairwise; Test Generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2010 Third International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-6435-7
Type :
conf
DOI :
10.1109/ICST.2010.43
Filename :
5477055
Link To Document :
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