• DocumentCode
    2534591
  • Title

    Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines

  • Author

    Perrouin, Gilles ; Sen, Sagar ; Klein, Jacques ; Baudry, Benoit ; Le Traon, Yves

  • Author_Institution
    LASSY, Univ. of Luxembourg, Luxembourg City, Luxembourg
  • fYear
    2010
  • fDate
    6-10 April 2010
  • Firstpage
    459
  • Lastpage
    468
  • Abstract
    Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPL models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed “all-at-once´”. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on Aspect OPTIMA, a concrete transactional SPL.
  • Keywords
    program testing; Alloy; Aspect OPTIMA; SAT solvers; SPL models; T feature interactions; T-wise criteria; automated T-wise test case generation; combinatorial explosion; exhaustive testing; scalable T-wise test case generation; software product lines; Automatic testing; Combinatorial mathematics; Concrete; Costs; Encoding; Explosions; Product safety; Software safety; Software testing; Software tools; Alloy; Model-based Engineering and Testing; Software Product Lines; T-wise and pairwise; Test Generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation (ICST), 2010 Third International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-6435-7
  • Type

    conf

  • DOI
    10.1109/ICST.2010.43
  • Filename
    5477055