DocumentCode :
2534635
Title :
Nano-CMOS Mixed-Signal Circuit Metamodeling Techniques: A Comparative Study
Author :
Garitselov, Oleg ; Mohanty, Saraju P. ; Kougianos, Elias ; Patra, Priyadarsan
Author_Institution :
NanoSystem Design Lab. (NSDL, http://nsdl.cse.unt.edu), Univ. of North Texas, Denton, TX, USA
fYear :
2010
fDate :
20-22 Dec. 2010
Firstpage :
191
Lastpage :
196
Abstract :
Fast design space exploration of complex nano-CMOS mixed-signal circuits is an important problem. In this paper, a design process flow that uses metamodels is introduced. In this flow the most important task is the sampling of the design space. In this paper, different sampling techniques for producing an accurate metamodel are investigated to minimize the number of samples required by using a nano-CMOS ring oscillator (RO) as an example. Through SPICE simulations, it is shown that the parasitics have a drastic effect on performance metrics, such as the frequency of oscillation. Alternative sampling techniques, both random, such as Monte Carlo (MC), and uniform, such as Latin Hypercube Sampling (LHS), and Design of Experiments (DOE), are considered as and compared for speed and accuracy. Due to the time constraints of the circuit design process, this paper can be used as a guideline for which sampling technique will produce the most accurate result to minimize the design time. All a experimental results are presented for a 45 nm technology.
Keywords :
CMOS integrated circuits; Monte Carlo methods; SPICE; design of experiments; mixed analogue-digital integrated circuits; nanoelectronics; Latin hypercube sampling; Monte Carlo method; SPICE simulations; design of experiments; design process flow; metamodeling techniques; nano-CMOS mixed-signal circuit; Hypercubes; Integrated circuit modeling; Layout; Mathematical model; Ring oscillators; Semiconductor device modeling; US Department of Energy; Circuit Simulation; Metmodeling; Mixed-Signal Circuits; Nanoscale CMOS; Statistical Sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System Design (ISED), 2010 International Symposium on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4244-8979-4
Electronic_ISBN :
978-0-7695-4294-2
Type :
conf
DOI :
10.1109/ISED.2010.44
Filename :
5715174
Link To Document :
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