DocumentCode :
2534661
Title :
Accuracy in digital measurement of single-shot waveform
Author :
Kawamura, T. ; Ishii, M. ; Michishita, K.
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
fYear :
1988
fDate :
12-16 Sep 1988
Firstpage :
303
Abstract :
The single-shot waveform is often the object of high-voltage measurement. The estimation method must be established. It is important to know the quality of random error and to estimate the substantial resolution, called the EB (effective bits). The average method and revised average method are presented. It is shown that the revised average method is superior by experiment and simulation. The standardization of the digitizer in high-voltage measurement is discussed. The measuring accuracy in the worst case using raw data must be estimated for the standardization of the digitizer. The estimated measuring accuracy of Gaussian pulse in the worst case is presented. From these results a digitizer with optimum characteristics can be selected for the measurement of dielectric phenomena
Keywords :
dielectric measurement; digital instrumentation; high-voltage techniques; measurement errors; waveform analysis; Gaussian pulse; average method; dielectric phenomena; digital measurement; effective bits; high-voltage measurement; measuring accuracy; random error; revised average method; simulation; single-shot waveform; standardization; substantial resolution; Dielectric measurements; Equations; Erbium; Least squares methods; Measurement standards; Pulse measurements; Quantization; Standardization; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/ICPADM.1988.38395
Filename :
38395
Link To Document :
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