Title :
Low-temperature sealing for optical microsystem packages using Au-Au surface activated bonding in atmospheric pressure environment
Author :
Yamamoto, S. ; Higurashi, E. ; Suga, T. ; Sawada, R.
Author_Institution :
Dept. of Precision Eng., Univ. of Tokyo, Tokyo, Japan
Abstract :
For chip-size packaging of optical microsystems, surface activated bonding (SAB) method is one attractive candidate because of its low-temperature process. However, most of packaging processes with SAB method have been performed under ultra-high vacuum conditions, because it needs maintaining the activated surface during bonding process. In this study, we demonstrate low-temperature hermetic sealing at atmospheric pressure using Au-Au SAB, because Au is not oxidized and its activated surface can be kept for several tens of minutes in ambient air. Strong bonding force and hermeticity were experimentally confirmed by low-temperature SAB bonding (150°C).
Keywords :
atmospheric pressure; bonding processes; chip scale packaging; hermetic seals; low-temperature techniques; atmospheric pressure environment; chip-size packaging; low-temperature hermetic sealing; low-temperature process; optical microsystem packages; surface activated bonding; ultra high vacuum conditions; Bonding; Gold; Plasma temperature; Silicon; Substrates; Testing; Hermetic packaging; Low-temperature bonding; Optical microsystem;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0157-3
DOI :
10.1109/TRANSDUCERS.2011.5969529