• DocumentCode
    2535250
  • Title

    A Note on Sample Complexity of Learning Binary Output Neural Networks under Fixed Input Distributions

  • Author

    Pestov, Vladimir

  • Author_Institution
    Dept. of Math. & Stat., Univ. of Ottawa, Ottawa, ON, Canada
  • fYear
    2010
  • fDate
    23-28 Oct. 2010
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    We show that the learning sample complexity of a sigmoidal neural network constructed by Sontag (1992) required to achieve a given misclassification error under a fixed purely atomic distribution can grow arbitrarily fast: for any prescribed rate of growth there is an input distribution having this rate as the sample complexity, and the bound is asymptotically tight. The rate can be super exponential, a non-recursive function, etc. We further observe that Sontag´s ANN is not Glivenko-Cantelli under any input distribution having a non-atomic part.
  • Keywords
    learning (artificial intelligence); neural nets; atomic distribution; fixed input distributions; learning; misclassification error; sample complexity; sigmoidal neural network; Accuracy; Artificial neural networks; Atomic measurements; Complexity theory; Extraterrestrial measurements; Loss measurement; Probability distribution; PAC learnability; Sontag´s ANN; fixed distribution learning; infinite VC dimension; precompactness; sample complexity; witness of irregularity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks (SBRN), 2010 Eleventh Brazilian Symposium on
  • Conference_Location
    Sao Paulo
  • ISSN
    1522-4899
  • Print_ISBN
    978-1-4244-8391-4
  • Electronic_ISBN
    1522-4899
  • Type

    conf

  • DOI
    10.1109/SBRN.2010.10
  • Filename
    5715205