DocumentCode
2535296
Title
The sensitivity of stiction performance to surface chemistry under various humidity regimes
Author
Sammoura, Firas ; Yang, Ken
Author_Institution
Masdar Inst. of Sci. & Technol., Abu Dhabi, United Arab Emirates
fYear
2011
fDate
5-9 June 2011
Firstpage
1400
Lastpage
1403
Abstract
The sensitivity of MEMS devices, treated with two different anti-stiction coatings, to stiction under various humidity conditions has been investigated for the first time. Stiction wafer-level testing with pull-in/pull-out voltage technique was used to detect stiction on capped and uncapped wafers. Experimental data showed that devices coated with phenyl-siloxane (Coating A) were sensitive to the humidity levels in the surrounding environment. Although uncapped devices did not show stiction at ambient humidity using the pull-in/pull-out test, successive drops in pull-out voltage were observed as the conditions became drier. On the other hand, devices coated with fluorinated silane (Coating B) were not affected by the modulation in the humidity levels. The results were explained in terms of wetting contact angle (WCA) of the two coatings where improved hydrophobicity of Coating B mitigated adhesive capillary forces. The surface voltages of Coating A and Coating B were measured, and the differences were related to the dipole moment of each film. This unprecedented demonstration opens up new opportunities for further understanding stiction in MEMS devices and implementing the necessary solutions.
Keywords
hydrophobicity; stiction; surface chemistry; wetting; MEMS devices; antistiction coatings; fluorinated silane; hydrophobicity; stiction performance; stiction wafer-level testing; surface chemistry; wetting contact angle; Coatings; Electric potential; Humidity; Micromechanical devices; Surface charging; Surface treatment; Voltage measurement; SAM coatings; Stiction; contact angle; humidity; pull-in/pull-out test; surface voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location
Beijing
ISSN
Pending
Print_ISBN
978-1-4577-0157-3
Type
conf
DOI
10.1109/TRANSDUCERS.2011.5969535
Filename
5969535
Link To Document