DocumentCode :
2535360
Title :
Bend loss characterization of direct write rib waveguides induced in Ge0.2Se0.8 chalcogenide glass using electron beams
Author :
Hoffman, Galen B. ; Reano, Ronald M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear :
2009
fDate :
4-8 Oct. 2009
Firstpage :
332
Lastpage :
333
Abstract :
Rib waveguides in Ge0.2Se0.8 films are fabricated by the direct write of electron beams. Numerical analysis shows that bend loss decreases with electron beam exposure count for constant bend radius.
Keywords :
chalcogenide glasses; electron beams; germanium compounds; numerical analysis; optical fabrication; optical losses; optical waveguides; Ge0.2Se0.8; bend loss; chalcogenide glass; direct write rib waveguides; electron beam exposure; numerical analysis; Electromagnetic waveguides; Electron beams; Glass; Magnetic materials; Optical films; Optical losses; Optical pulses; Pulsed laser deposition; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
ISSN :
1092-8081
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
Type :
conf
DOI :
10.1109/LEOS.2009.5343258
Filename :
5343258
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2535360
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