Title :
Multilevel flash memory on-chip error correction based on trellis coded modulation
Author :
Sun, Fei ; Devarajan, Siddharth ; Rose, Ken ; Zhang, Tong
Author_Institution :
Dept. of ECSE, Rensselaer Polytech. Inst.
Abstract :
This paper presents a multilevel (ML) flash memory on-chip error correction system design based on the concept of trellis coded modulation (TCM). This is motivated by the non-trivial modulation process in ML memory storage and the effectiveness of TCM on integrating coding with modulation to provide better performance. Using code storage 2bits/cell flash memory as a test vehicle, the effectiveness of TCM-based systems, in terms of error-correcting performance, coding redundancy, silicon cost, and operation latency, has been successfully demonstrated
Keywords :
error correction; flash memories; redundancy; trellis coded modulation; multilevel flash memory; on-chip error correction system design; trellis coded modulation; Costs; Delay; Error correction codes; Flash memory; Modulation coding; Redundancy; Silicon; System testing; System-on-a-chip; Vehicles;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1692867