Title :
Transient charge conduction in high field stressed dielectrics
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
Recent Kerr electrooptic field and charge mapping measurements in electron-beam-irradiated and high-voltage-stressed solid dielectrics are analyzed in terms of a drift-dominated conduction model. A one-dimensional model with a lossy dielectric medium is treated. Attention is directed to the transient decay after the excitation is removed and the terminals are either short- or open-circuited. The effects of relaxation are investigated
Keywords :
Kerr electro-optical effect; charge measurement; electron beam effects; transients; Kerr electrooptic field; charge mapping measurements; drift-dominated conduction model; excitation; high field stressed dielectrics; high-voltage-stressed solid dielectrics; lossy dielectric medium; one-dimensional model; open-circuited; relaxation; short circuited; transient decay; Current density; Dielectric losses; Differential equations; Electrodes; Region 1; Short circuit currents; Solids; Voltage;
Conference_Titel :
Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
Conference_Location :
Cambridge, MA
DOI :
10.1109/ELINSL.1988.13924
