• DocumentCode
    253550
  • Title

    Lacunarity Analysis on Image Patterns for Texture Classification

  • Author

    Yuhui Quan ; Yong Xu ; Yuping Sun ; Yu Luo

  • Author_Institution
    Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    160
  • Lastpage
    167
  • Abstract
    Based on the concept of lacunarity in fractal geometry, we developed a statistical approach to texture description, which yields highly discriminative feature with strong robustness to a wide range of transformations, including photometric changes and geometric changes. The texture feature is constructed by concatenating the lacunarity-related parameters estimated from the multi-scale local binary patterns of image. Benefiting from the ability of lacunarity analysis to distinguish spatial patterns, our method is able to characterize the spatial distribution of local image structures from multiple scales. The proposed feature was applied to texture classification and has demonstrated excellent performance in comparison with several state-of-the- art approaches on four benchmark datasets.
  • Keywords
    fractals; image classification; image texture; statistical analysis; benchmark datasets; discriminative feature; fractal geometry; geometric changes; image patterns; image texture classification; lacunarity analysis; lacunarity-related parameters; local image structures; multiscale local binary patterns; photometric changes; spatial patterns; statistical approach; texture description; Distribution functions; Feature extraction; Fractals; Frequency measurement; Graphical models; Robustness; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPR.2014.28
  • Filename
    6909422