DocumentCode
253550
Title
Lacunarity Analysis on Image Patterns for Texture Classification
Author
Yuhui Quan ; Yong Xu ; Yuping Sun ; Yu Luo
Author_Institution
Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
fYear
2014
fDate
23-28 June 2014
Firstpage
160
Lastpage
167
Abstract
Based on the concept of lacunarity in fractal geometry, we developed a statistical approach to texture description, which yields highly discriminative feature with strong robustness to a wide range of transformations, including photometric changes and geometric changes. The texture feature is constructed by concatenating the lacunarity-related parameters estimated from the multi-scale local binary patterns of image. Benefiting from the ability of lacunarity analysis to distinguish spatial patterns, our method is able to characterize the spatial distribution of local image structures from multiple scales. The proposed feature was applied to texture classification and has demonstrated excellent performance in comparison with several state-of-the- art approaches on four benchmark datasets.
Keywords
fractals; image classification; image texture; statistical analysis; benchmark datasets; discriminative feature; fractal geometry; geometric changes; image patterns; image texture classification; lacunarity analysis; lacunarity-related parameters; local image structures; multiscale local binary patterns; photometric changes; spatial patterns; statistical approach; texture description; Distribution functions; Feature extraction; Fractals; Frequency measurement; Graphical models; Robustness; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/CVPR.2014.28
Filename
6909422
Link To Document