Title :
The effect of morphology on electric and electronic properties of polyimide films
Author :
WeiJun, Yin ; BaoJing, Yang ; HeKang, Zhang
Author_Institution :
Polymeric Mater. Inst., Shanghai Jiao Tong Univ., China
Abstract :
Samples of polyimide (PI) films oriented by uniaxial drawing with different drawing ratios were investigated. The steady photocurrents of these samples were measured to study the relationship between morphology and electronic properties of PI films. The oriented structures of drawn PI films were detected by the X-ray diffraction method and polarized infrared absorption spectra. It is shown that the orientations tend to be parallel to the drawing direction, and the orientation degree increases with drawing ratio. Moreover, it is suggested that there exist two types of trap in PI films, and the variation of CTC (charge transfer complex) formation during drawing may affect the trap structures
Keywords :
X-ray diffraction examination of materials; infrared spectra of organic molecules and substances; organic insulating materials; photoconductivity; polymer films; PI films; X-ray diffraction; charge transfer complex; drawing ratios; effect of morphology; electronic properties; orientation degree; oriented structures; polarized infrared absorption spectra; polyimide films; steady photocurrents; trap structures; types of trap; uniaxial drawing; Electromagnetic wave absorption; Infrared detectors; Infrared spectra; Morphology; Photoconductivity; Polarization; Polyimides; X-ray detection; X-ray detectors; X-ray diffraction;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
Conference_Location :
Beijing
DOI :
10.1109/ICPADM.1988.38423
