The effect of morphology on electric and electronic properties of polyimide films

Author

WeiJun, Yin ; BaoJing, Yang ; HeKang, Zhang

Author_Institution

Polymeric Mater. Inst., Shanghai Jiao Tong Univ., China

fYear

1988

fDate

12-16 Sep 1988

Firstpage

420

Abstract

Samples of polyimide (PI) films oriented by uniaxial drawing with different drawing ratios were investigated. The steady photocurrents of these samples were measured to study the relationship between morphology and electronic properties of PI films. The oriented structures of drawn PI films were detected by the X-ray diffraction method and polarized infrared absorption spectra. It is shown that the orientations tend to be parallel to the drawing direction, and the orientation degree increases with drawing ratio. Moreover, it is suggested that there exist two types of trap in PI films, and the variation of CTC (charge transfer complex) formation during drawing may affect the trap structures

Keywords

X-ray diffraction examination of materials; infrared spectra of organic molecules and substances; organic insulating materials; photoconductivity; polymer films; PI films; X-ray diffraction; charge transfer complex; drawing ratios; effect of morphology; electronic properties; orientation degree; oriented structures; polarized infrared absorption spectra; polyimide films; steady photocurrents; trap structures; types of trap; uniaxial drawing; Electromagnetic wave absorption; Infrared detectors; Infrared spectra; Morphology; Photoconductivity; Polarization; Polyimides; X-ray detection; X-ray detectors; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of

Conference_Location

Beijing

Type

conf

DOI

10.1109/ICPADM.1988.38423

Filename

38423