• DocumentCode
    2535668
  • Title

    Electrolytic hydrogenation technique: New approach for the modification of Ti-film mechanical properties and MEMS applications

  • Author

    Cheng, Chao-Lin ; Su, Wang-Shen ; Tuan, Yu-Tsung ; Shih, Ming-Hao ; Wu, Tair-I ; Fang, Weileun

  • Author_Institution
    Power Mech. Eng. Dept., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    2702
  • Lastpage
    2705
  • Abstract
    This study reports a novel low temperature electrolytic hydrogenation technique to modify mechanical properties of metal films. To demonstrate the feasibility of this approach, various current densities and cathodic charging periods of electrolytic hydrogenation processes were implemented to modify the mechanical properties of Ti-film. Preliminary results demonstrate the feasibility of modulating the Young´s modulus, residual stress, and hardness, of Ti-film. Note: the electrolytic hydrogenation technique can be applied for other metal films. Since electrolytic hydrogenation process is simple and low temperature, it is a promising approach to modulate mechanical characteristics of MEMS structures.
  • Keywords
    Young´s modulus; hardness; hydrogenation; internal stresses; micromechanical devices; thin films; titanium; MEMS structures; Ti; Young´s modulus; electrolytic hydrogenation technique; hardness; mechanical properties; metal films; residual stress; Films; Metals; Residual stresses; Surface treatment; Young´s modulus; Electrolytic hydrogenation technique; Mechanical properties; Titanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969556
  • Filename
    5969556