DocumentCode :
253585
Title :
Bayesian Active Contours with Affine-Invariant, Elastic Shape Prior
Author :
Bryner, Darshan ; Srivastava, Anurag
Author_Institution :
Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
fYear :
2014
fDate :
23-28 June 2014
Firstpage :
312
Lastpage :
319
Abstract :
Active contour, especially in conjunction with prior-shape models, has become an important tool in image segmentation. However, most contour methods use shape priors based on similarity-shape analysis, i.e. analysis that is invariant to rotation, translation, and scale. In practice, the training shapes used for prior-shape models may be collected from viewing angles different from those for the test images and require invariance to a larger class of transformation. Using an elastic, affine-invariant shape modeling of planar curves, we propose an active contour algorithm in which the training and test shapes can be at arbitrary affine transformations, and the resulting segmentation is robust to perspective skews. We construct a shape space of affine-standardized curves and derive a statistical model for capturing class-specific shape variability. The active contour is then driven by the true gradient of a total energy composed of a data term, a smoothing term, and an affine-invariant shape-prior term. This framework is demonstrated using a number of examples involving the segmentation of occluded or noisy images of targets subject to perspective skew.
Keywords :
Bayes methods; computational geometry; image segmentation; statistical analysis; Bayesian active contour; affine-invariant shape modeling; affine-invariant shape-prior term; affine-standardized curve; class-specific shape variability; data term; elastic shape prior; image segmentation; planar curves; similarity-shape analysis; smoothing term; statistical model; Active contours; Algorithms; Bayes methods; Computational modeling; Measurement; Shape; Space vehicles; Active contour; Affine shape analysis; Riemannian geometry; shape modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/CVPR.2014.47
Filename :
6909441
Link To Document :
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