DocumentCode :
2535911
Title :
Influence of Parameters of the Transient Grounding Model on Numerical Analysis and Experimental Verification
Author :
Hongbing, He ; Bihua, Zhou ; Jiaqing, Chen
Author_Institution :
PLA Univ. of Sci. & Tech., Nanjing
fYear :
2007
fDate :
23-26 Oct. 2007
Firstpage :
27
Lastpage :
30
Abstract :
This paper discussed the influence of the parameters of the transient grounding model on numerical analysis using FDTD method; some useful results are given and verified by the experiment.
Keywords :
earthing; finite difference time-domain analysis; transients; FDTD method; numerical analysis; transient grounding model; EMP radiation effects; Electrodes; Fluctuations; Grounding; Magnetic analysis; Numerical analysis; Numerical models; Testing; Transient analysis; Voltage; Grounding; Grounding Experiment; Transient grounding resistance (TGR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
Type :
conf
DOI :
10.1109/ELMAGC.2007.4413423
Filename :
4413423
Link To Document :
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