DocumentCode :
2535984
Title :
Imaging interferometric microscopy- resolution to the linear systems limits
Author :
Brueck, S.R.J.
Author_Institution :
Depts. of Phys. & Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
fYear :
2009
fDate :
4-8 Oct. 2009
Firstpage :
238
Lastpage :
239
Abstract :
Imaging interferometric microscopy resolution to lambda/2(nsub+1) (nsub = substrate refractive index) is demonstrated using evanescent-wave illumination. Resolution to 150 nm (lambda/4.2) is achieved using a 633 nm source and a 0.4 NA lens.
Keywords :
fibre optic sensors; image resolution; interferometry; optical microscopy; evanescent-wave illumination; imaging interferometric microscopy; linear systems limits; Frequency; High-resolution imaging; Image reconstruction; Image resolution; Lighting; Linear systems; Optical microscopy; Optical scattering; Optical surface waves; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
ISSN :
1092-8081
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
Type :
conf
DOI :
10.1109/LEOS.2009.5343293
Filename :
5343293
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2535984
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