DocumentCode :
2536050
Title :
Time Domain Measurement of Voltage Rise Time and Current Rise Time Due to Low Voltage ESD using 12GHz Experimental System
Author :
Kawamata, K. ; Taka, Y. ; Minegishi, S. ; Haga, A. ; Fujiwara, O.
Author_Institution :
Hachinohe Inst. of Technol., Aomori
fYear :
2007
fDate :
23-26 Oct. 2007
Firstpage :
55
Lastpage :
58
Abstract :
Voltage rise time and current rise time due to small gap discharge as the low voltage ESD was investigated in time domain. The measurement system was improved on the band width from 6 GHz to 12 GHz using the coaxial electrode system. Also, the sensing system was changed from the coupled transmission lines to an E-field sensor and a H-field sensor. The insertion loss of the experimental system was within about -3 dB in frequency range below 12 GHz. As a consequence of the experiment using the system, voltage and current rise time of transition duration were shown 32 ps or less. The rise times were changed in configuration of electrodes, source polarity and discharging voltage. Besides, breakdown field was examined to corroborate the very fast transition durations of about 32 ps. The breakdown field was very high of about 8times10 V/m in low voltage discharging of below 330 V.
Keywords :
electrostatic discharge; microwave detectors; time-domain analysis; transmission lines; E-field sensor; ESD; breakdown field; coaxial electrode system; frequency 6 GHz to 12 GHz; gap discharge; insertion loss; sensing system; time domain measurement; transmission lines; voltage discharging; voltage rise; Coaxial components; Couplings; Current measurement; Electrodes; Electrostatic discharge; Low voltage; Sensor systems; Time measurement; Transmission line measurements; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
Type :
conf
DOI :
10.1109/ELMAGC.2007.4413430
Filename :
4413430
Link To Document :
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