Title :
Fast, Approximate Piecewise-Planar Modeling Based on Sparse Structure-from-Motion and Superpixels
Author :
Bodis-Szomoru, Andras ; Riemenschneider, Hayko ; Van Gool, Luc
Author_Institution :
Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
Abstract :
State-of-the-art Multi-View Stereo (MVS) algorithms deliver dense depth maps or complex meshes with very high detail, and redundancy over regular surfaces. In turn, our interest lies in an approximate, but light-weight method that is better to consider for large-scale applications, such as urban scene reconstruction from ground-based images. We present a novel approach for producing dense reconstructions from multiple images and from the underlying sparse Structure-from-Motion (SfM) data in an efficient way. To overcome the problem of SfM sparsity and textureless areas, we assume piecewise planarity of man-made scenes and exploit both sparse visibility and a fast over-segmentation of the images. Reconstruction is formulated as an energy-driven, multi-view plane assignment problem, which we solve jointly over superpixels from all views while avoiding expensive photoconsistency computations. The resulting planar primitives -- defined by detailed superpixel boundaries -- are computed in about 10 seconds per image.
Keywords :
image reconstruction; image segmentation; stereo image processing; MVS algorithms; SfM data; SfM sparsity; dense depth maps; dense reconstructions; fast image over-segmentation; ground-based images; image reconstruction; light-weight method; man-made scenes; multi-view stereo algorithms; piecewise planarity; piecewise-planar modeling; sparse structure-from-motion data; superpixel boundary; textureless areas; urban scene reconstruction; Image color analysis; Image reconstruction; Image segmentation; Optimization; Robustness; Surface reconstruction; Three-dimensional displays; SfM; multi-view; photoconsistency; piecewise-planar; plane fitting; reconstruction; segmentation; sparse; structure-from-motion; superpixels;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
DOI :
10.1109/CVPR.2014.67