DocumentCode
2536325
Title
Integrating observability don´t cares in all-solution SAT solvers
Author
Safarpour, Sean ; Veneris, Andreas ; Drechsler, Rolf
Author_Institution
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont.
fYear
2006
fDate
21-24 May 2006
Lastpage
1590
Abstract
All-solution Boolean satisfiability (SAT) solvers are engines employed to find all the possible solutions to a SAT problem. Their applications are found throughout the EDA industry in fields such as formal verification, circuit synthesis and automatic test pattern generation. Typically, these engines iteratively find each solution by calling a standard SAT solving procedure. Each solution is minimized using different post processing techniques and the problem is constrained to prevent recurring solutions. In this work, instead of applying post processing techniques, the objective is to minimize the size of the solution "on the fly" during the all-solution SAT solving process. This is achieved by allowing the solver to exploit the structural circuit observability don\´t cares (ODC) arising from the problem. The solver makes decisions such that the number of ODCs is maximized in each solution thus leading to an overall smaller number of iterations. Through extensive experiments, it is demonstrated that integrating ODC techniques within an all-solution SAT solver results in increased performance and more compact solutions
Keywords
Boolean algebra; automatic test pattern generation; computability; electronic design automation; formal verification; all-solution Boolean satisfiability; all-solution SAT solvers; automatic test pattern generation; circuit synthesis; electronic design automation; formal verification; observability don´t cares; Automatic test pattern generation; Circuit synthesis; Circuit testing; Decision making; Electronic design automation and methodology; Engines; Formal verification; Observability; Standards development; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location
Island of Kos
Print_ISBN
0-7803-9389-9
Type
conf
DOI
10.1109/ISCAS.2006.1692903
Filename
1692903
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