Title :
Upper bounds for the degree of sequential diagnosability
Author :
Ohtsuka, Takashi ; Ueno, Shuichi
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
It is known that an n-dimensional grid with N vertices, an N-vertex hypercube, and a k-ary tree with N vertices are sequentially Ω(Nn(n+1)/)-, Ω(N log log N/log N)-, and Ω(√N/k)-diagnosable, respectively. This paper shows that they are sequentially O(Nn(n+1)/)-, O(N log log N/√log N)-, and o(√kN)-diagnosable, respectively
Keywords :
directed graphs; fault diagnosis; hypercube networks; multiprocessor interconnection networks; N-vertex hypercube; fault sets; interconnection network; k-ary tree; multiprocessor system; n-dimensional grid; sequential diagnosability degree; upper bounds; Grid computing; Hypercubes; Multiprocessor interconnection networks; Performance evaluation; Sequential diagnosis; System testing; Tree graphs; Upper bound;
Conference_Titel :
Circuits and Systems, 1998. IEEE APCCAS 1998. The 1998 IEEE Asia-Pacific Conference on
Conference_Location :
Chiangmai
Print_ISBN :
0-7803-5146-0
DOI :
10.1109/APCCAS.1998.743920
