DocumentCode
2536563
Title
Inexpensive approach to dielectric measurements
Author
Korpas, Przemyslaw ; Wojtasiak, Wojciech ; Krupka, Jerzy ; Gwarek, Wojciech
Author_Institution
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
Volume
1
fYear
2012
fDate
21-23 May 2012
Firstpage
154
Lastpage
157
Abstract
Split post dielectric resonators (SPDR) are commonly used for measurements of complex permittivity and losses measurements of many materials. The permittivity of the sample is calculated basing on the change in a resonance curve of the loaded and unloaded SPDR. The paper presents an inexpensive replacement for Vector Network Analyser normally used to determine the resonator´s Q-factor. The proposed system is recommended for those customers, who don´t need such rich-featured equipment as VNAs.
Keywords
Q-factor; dielectric resonators; network analysers; permittivity measurement; Q-factor; complex permittivity measurements; dielectric measurements; losses measurements; split post dielectric resonators; vector network analyser; Detectors; Frequency measurement; Permittivity measurement; Q factor; Resonant frequency; Wideband; Lorenz curve; Split post dielectoric resonator; q-factor; resonance frequency; vector network analyser;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radar and Wireless Communications (MIKON), 2012 19th International Conference on
Conference_Location
Warsaw
Print_ISBN
978-1-4577-1435-1
Type
conf
DOI
10.1109/MIKON.2012.6233486
Filename
6233486
Link To Document