Title :
Artificial intelligence in test
Author :
Dean, Jeffrey S.
Author_Institution :
Adv. Diagnostics & Technol. Insertion Center, Kelly AFB, TX, USA
Abstract :
This paper discusses the subject of applying artificial intelligence techniques to automatic test. It has been the experience of the author that AI is not a “magic bullet”, and that its successful use requires an understanding of both the technology and the repair process if is being applied to
Keywords :
artificial intelligence; automatic testing; circuit testing; artificial intelligence; automatic test; repair process; Artificial intelligence; Artificial neural networks; Automatic testing; Circuit analysis; Circuit testing; Expert systems; Genetic algorithms; Infrared detectors; System testing; Vehicle crash testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547718
