Title :
Research on low reflection Material of double layer medium structure
Author :
Yanfei, Li ; Guizhen, Lu ; Dazhi, Piao ; Yalin, Guan ; Wenjie, Zhang
Author_Institution :
Commun. Univ. of China, Beijing
Abstract :
Low reflection material is very useful in many applications. At present, the operation frequency in the most absorbing materials are above 4 GHz, for it is difficult to realize the low reflection below 4 GHz with thin structure. A thin structure material that realize the low reflection was studied by using the analog circuit method in this issue. A genetic algorithm is used to find the optimization parameter. The simulations by equivalent circuit and FEM methods show a low reflection between 2 GHz and 9 GHz, which is only 9 mm thick and the value of reflection loss is lower than -6 dB.
Keywords :
electromagnetic wave absorption; electromagnetic wave reflection; equivalent circuits; finite element analysis; genetic algorithms; microwave materials; microwave propagation; FEM method; absorbing materials; analog circuit method; double layer medium structure; equivalent circuit; frequency 2 GHz to 9 GHz; genetic algorithm; low reflection material; optimization; reflection loss; Analog circuits; Capacitance; Composite materials; Electromagnetic reflection; Equivalent circuits; Frequency; Genetic algorithms; Impedance; Inorganic materials; Transmission line theory; Equivalent Circuit; Genetic Algorithm; Low Reflection; Optimization;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
DOI :
10.1109/ELMAGC.2007.4413486
