Title :
Electromagnetic Emanations of the ICs
Author :
Guo-liang, Ding ; Qiang, Zhao ; Jie, Chu ; Gao-ming, Deng
Author_Institution :
Mech. Eng. Coll., Shijiazhuang
Abstract :
This paper presents an investigation of the leakage of compromising information via electromagnetic (EM) emanations from cryptographic modules or other ICs. The paper describes the work characters of static CMOS gates firstly. Based on the concrete circuit which was realized with an AT89C52 microchip, we made experiments of near field measurements to the EM emanation of the AT89C52 module. The result of the experiments shows that there is data-EM emanation correlation for working ICs.
Keywords :
CMOS logic circuits; cryptography; electromagnetic compatibility; logic gates; microprocessor chips; AT89C52 microchip; EMC; compromising information leakage; concrete circuit; cryptographic modules; data-EM emanation correlation; electromagnetic emanations; integrated circuits; near field measurements; static CMOS gates; Clocks; Data processing; Electromagnetic fields; Electromagnetic measurements; Integrated circuit interconnections; Inverters; Logic devices; Parasitic capacitance; Power measurement; Wires; Compromising Information; EM Emanation; IC; Static CMOS; data-EM emanation correlation;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
DOI :
10.1109/ELMAGC.2007.4413491
