Electromagnetic Emanations of the ICs

Author

Guo-liang, Ding ; Qiang, Zhao ; Jie, Chu ; Gao-ming, Deng

Author_Institution

Mech. Eng. Coll., Shijiazhuang

fYear

2007

fDate

23-26 Oct. 2007

Firstpage

303

Lastpage

304

Abstract

This paper presents an investigation of the leakage of compromising information via electromagnetic (EM) emanations from cryptographic modules or other ICs. The paper describes the work characters of static CMOS gates firstly. Based on the concrete circuit which was realized with an AT89C52 microchip, we made experiments of near field measurements to the EM emanation of the AT89C52 module. The result of the experiments shows that there is data-EM emanation correlation for working ICs.

Keywords

CMOS logic circuits; cryptography; electromagnetic compatibility; logic gates; microprocessor chips; AT89C52 microchip; EMC; compromising information leakage; concrete circuit; cryptographic modules; data-EM emanation correlation; electromagnetic emanations; integrated circuits; near field measurements; static CMOS gates; Clocks; Data processing; Electromagnetic fields; Electromagnetic measurements; Integrated circuit interconnections; Inverters; Logic devices; Parasitic capacitance; Power measurement; Wires; Compromising Information; EM Emanation; IC; Static CMOS; data-EM emanation correlation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on

Conference_Location

Qingdao

Print_ISBN

978-1-4244-1371-3

Electronic_ISBN

978-1-4244-1372-0

Type

conf

DOI

10.1109/ELMAGC.2007.4413491

Filename

4413491