Title :
Terahertz frequency-domain instrumentation for vector characterization of composite materials
Author :
Yashchyshyn, Yevhen ; Derzakowski, Krzysztof ; Modelski, Józef ; Godziszewski, Konrad
Author_Institution :
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
In this paper the introduction to the sub-THz technologies is presented. Many aspects of the sub-THz measurement techniques are reviewed and compared. A unique laboratory of Institute of Radioelectronics at Warsaw University of Technology equipped with the VNA with Frequency Extenders up to 500 GHz is demonstrated.
Keywords :
composite materials; materials testing; microwave measurement; submillimetre wave measurement; submillimetre wave spectroscopy; terahertz spectroscopy; VNA; composite material vector characterization; subterahertz technology; terahertz frequency domain instrumentation; Antenna measurements; Frequency measurement; Permittivity; Permittivity measurement; Refractive index; Semiconductor device measurement; measurement technologies; sub-THz frequency band;
Conference_Titel :
Microwave Radar and Wireless Communications (MIKON), 2012 19th International Conference on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-1435-1
DOI :
10.1109/MIKON.2012.6233515
