• DocumentCode
    2537471
  • Title

    Verification of the phase-noise model for MEMS oscillators operating in the nonlinear regime

  • Author

    Lee, H.K. ; Ward, P.A. ; Duwel, A.E. ; Salvia, J.C. ; Qu, Y.Q. ; Melamud, R. ; Chandorkar, S.A. ; Hopcroft, M.A. ; Kim, B. ; Kenny, T.W.

  • Author_Institution
    Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    510
  • Lastpage
    513
  • Abstract
    We experimentally verify the phase-noise model for oscillators operating in a nonlinear regime by testing a micromechanical resonator-based oscillator (MEMS oscillator). Operation of oscillators in the nonlinear regime had been believed to induce instability - a belief we have demonstrated to be mistaken. As a result of this misunderstanding, little study has been devoted to the phase-noise performance of oscillators in the nonlinear regime. In this study, we compare measurements of the phase noise of MEMS oscillators far into the nonlinear regime and compare them with a recent prediction. This paper provides confirmation that low phase-noise performance is possible in the nonlinear regime, and confirms that models can be used to predict and optimize performance.
  • Keywords
    micromechanical resonators; oscillators; phase measurement; phase noise; MEMS oscillator; micromechanical resonator-based oscillator; nonlinear regime; phase noise measurement; phase-noise model; Feedback circuits; Micromechanical devices; Phase measurement; Phase noise; Resonant frequency; nonlinearity; oscillator; phase noise; resonator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969667
  • Filename
    5969667