DocumentCode :
2537471
Title :
Verification of the phase-noise model for MEMS oscillators operating in the nonlinear regime
Author :
Lee, H.K. ; Ward, P.A. ; Duwel, A.E. ; Salvia, J.C. ; Qu, Y.Q. ; Melamud, R. ; Chandorkar, S.A. ; Hopcroft, M.A. ; Kim, B. ; Kenny, T.W.
Author_Institution :
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
510
Lastpage :
513
Abstract :
We experimentally verify the phase-noise model for oscillators operating in a nonlinear regime by testing a micromechanical resonator-based oscillator (MEMS oscillator). Operation of oscillators in the nonlinear regime had been believed to induce instability - a belief we have demonstrated to be mistaken. As a result of this misunderstanding, little study has been devoted to the phase-noise performance of oscillators in the nonlinear regime. In this study, we compare measurements of the phase noise of MEMS oscillators far into the nonlinear regime and compare them with a recent prediction. This paper provides confirmation that low phase-noise performance is possible in the nonlinear regime, and confirms that models can be used to predict and optimize performance.
Keywords :
micromechanical resonators; oscillators; phase measurement; phase noise; MEMS oscillator; micromechanical resonator-based oscillator; nonlinear regime; phase noise measurement; phase-noise model; Feedback circuits; Micromechanical devices; Phase measurement; Phase noise; Resonant frequency; nonlinearity; oscillator; phase noise; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969667
Filename :
5969667
Link To Document :
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