DocumentCode
2537684
Title
A systems view of test standardization
Author
Sheppard, John W. ; Simpson, William R.
Author_Institution
ARINC Res. Corp., Annapolis, MD, USA
fYear
1996
fDate
16-19 Sep 1996
Firstpage
384
Lastpage
389
Abstract
In test engineering, “system test” is frequently considered to be testing at a particular level in a product hierarchy. With increasing complexity in systems, testing at lower levels is now faced with problems previously encountered at the system level. For this reason, it is becoming increasingly important to apply a system perspective to testing. In this paper, we present a model of a “system” to be applied to test engineering which abstracts test information above the physical level of the product. We then describe how this model supports two standardization efforts within the IEEE-P1226 and P1232
Keywords
IEEE standards; automatic testing; production testing; standardisation; IEEE-P1226; IEEE-P1232; product hierarchy; system perspective; test engineering; test information; test standardization; Automatic testing; Bridges; Decision trees; Dictionaries; Electronic equipment testing; Fault diagnosis; Military standards; Procurement; Standardization; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location
Dayton, OH
ISSN
1088-7725
Print_ISBN
0-7803-3379-9
Type
conf
DOI
10.1109/AUTEST.1996.547729
Filename
547729
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