Title :
A systems view of test standardization
Author :
Sheppard, John W. ; Simpson, William R.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
Abstract :
In test engineering, “system test” is frequently considered to be testing at a particular level in a product hierarchy. With increasing complexity in systems, testing at lower levels is now faced with problems previously encountered at the system level. For this reason, it is becoming increasingly important to apply a system perspective to testing. In this paper, we present a model of a “system” to be applied to test engineering which abstracts test information above the physical level of the product. We then describe how this model supports two standardization efforts within the IEEE-P1226 and P1232
Keywords :
IEEE standards; automatic testing; production testing; standardisation; IEEE-P1226; IEEE-P1232; product hierarchy; system perspective; test engineering; test information; test standardization; Automatic testing; Bridges; Decision trees; Dictionaries; Electronic equipment testing; Fault diagnosis; Military standards; Procurement; Standardization; System testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547729
