• DocumentCode
    2537721
  • Title

    Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

  • Author

    Lin, Chun-Yu ; Chu, Li-Wei ; Ker, Ming-Dou ; Lu, Tse-Hua ; Hung, Ping-Fang ; Li, Hsiao-Chun

  • Author_Institution
    Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    23-25 May 2010
  • Firstpage
    573
  • Lastpage
    576
  • Abstract
    A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.
  • Keywords
    CMOS integrated circuits; MIMIC; electrostatic discharge; radiofrequency integrated circuits; CMOS process; ESD protection design; broadband RF CMOS process; electrostatic discharge protection; frequency 60 GHz; resistance 50 ohm; self-matched ESD cell library; CMOS process; CMOS technology; Circuits; Diodes; Electrostatic discharge; Inductors; Libraries; Protection; Radio frequency; Robustness; 60 GHz; Broadband; ESD cell; V-band; electrostatic discharge (ESD);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-6240-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2010.5477291
  • Filename
    5477291