DocumentCode :
2537831
Title :
A mm-wave arbitrary 2N band oscillator based on even-odd mode technique
Author :
Yu, Alvin Hsing-Ting ; Tam, Sai-Wang ; Murphy, David ; Itoh, Tatsuo ; Chang, M. C Frank
Author_Institution :
Univ. of California, Los Angeles, CA, USA
fYear :
2010
fDate :
23-25 May 2010
Firstpage :
141
Lastpage :
144
Abstract :
A technique to build mm-wave arbitrary 2N band oscillators is presented. Based on even-odd mode operation, the technique breaks the fundamental tradeoff between frequency switching range and tank quality factor, Q, which exists in classical switched-capacitor and switched-inductor methods. As a result, this technique achieves multiband operation with FOMs comparable to single band oscillators. To verify the theory, a quadruple band oscillator with 4 arbitrary chosen frequencies (43, 49, 58 and 75 GHz) is implemented in 65-nm CMOS technology. The phase noise measurements taking at 1 MHz offset are -100.3, -95.3, -93.8 and -86.2 dBc/Hz, respectively. The power consumption of the oscillator core is 12mW. The presented technique would enable the development of mm-wave software-defined multi-standard radios.
Keywords :
CMOS integrated circuits; millimetre wave oscillators; noise measurement; phase noise; switched capacitor networks; CMOS technology; even-odd mode technique; frequency 1 MHz; frequency 43 GHz; frequency 49 GHz; frequency 58 GHz; frequency 75 GHz; frequency switching range; mm-wave arbitrary 2N band oscillator; mm-wave software-defined multi-standard radios; multiband operation; phase noise measurements; power 12 mW; quadruple band oscillator; size 65 nm; switched-capacitor method; switched-inductor method; tank quality factor; CMOS technology; Capacitance; Couplings; Frequency; Inductors; Phase noise; Q factor; Switches; Transmission lines; Voltage-controlled oscillators; 60 GHz; CMOS; VCO; even-odd mode; mm-wave; multiband; oscillator; quadruple band; software-defined radio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-6240-7
Type :
conf
DOI :
10.1109/RFIC.2010.5477298
Filename :
5477298
Link To Document :
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