DocumentCode
2537888
Title
Quality factor enhancement in lamb wave resonators utilizing AlN plates with convex edges
Author
Lin, Chih-Ming ; Lai, Yun-Ju ; Yen, Ting-Ta ; Hsu, Jin-Chen ; Chen, Yung-Yu ; Senesky, Debbie G. ; Pisano, Albert P.
Author_Institution
Dept. of Mech. Eng., Univ. of California, Berkeley, CA, USA
fYear
2011
fDate
5-9 June 2011
Firstpage
1512
Lastpage
1515
Abstract
A novel Lamb wave resonator utilizing an aluminum nitride (AlN) plate with convex edges to enhance the quality factor (Q) is demonstrated for the first time. The finite element analysis (FEA) simulation results show that the mechanical energy can be more efficiently confined in the center of the AlN Lamb wave resonator by using the convex edges instead of the flat edges. Specifically, the measured frequency response for a 491.8-MHz AlN Lamb wave resonator with convex edges yields a Q of 3,280 which represents a 2.6× enhancement in Q over a 517.9-MHz AlN Lamb wave resonator with flat edges. Moreover, a 419.3-MHz Lamb wave resonator on an AlN/SiO2 composite plate with convex edges yields a Q of 4,792, representing a 3.8× increase in Q.
Keywords
III-V semiconductors; Q-factor; aluminium compounds; finite element analysis; surface acoustic wave resonators; wide band gap semiconductors; AlN; FEA simulation; aluminum nitride plate; convex edges; finite element analysis simulation; frequency 419.3 MHz; frequency 491.8 MHz; frequency 517.9 MHz; lamb wave resonators; mechanical energy; quality factor enhancement; Electrodes; Frequency measurement; Image edge detection; Mechanical energy; Resonant frequency; Shape; Silicon; Lamb wave resonators; RF MEMS; aluminum nitride (AlN); convex edges; energy loss; piezoelectric resonators; quality factor (Q); tether loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location
Beijing
ISSN
Pending
Print_ISBN
978-1-4577-0157-3
Type
conf
DOI
10.1109/TRANSDUCERS.2011.5969687
Filename
5969687
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