• DocumentCode
    2537919
  • Title

    Laterally-excited silicon bulk acoustic resonators with sidewall AlN

  • Author

    Tabrizian, R. ; Ayazi, F.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    1520
  • Lastpage
    1523
  • Abstract
    This paper presents lateral silicon bulk acoustic resonators that are piezoelectrically excited using a thin layer of AlN on their vertical sidewalls. Sputtered AlN coats the sidewalls of a 20 um thick resonator conformally and uniformly, enabling the excitation of width-extensional modes in a suspended silicon microstructure using the longitudinal piezoelectric stress coefficient e33. A motional resistance of ~35 Ω was measured in air for a 100 MHz silicon resonator, showing at least ten times smaller motional resistance compared to its capacitive counterpart.
  • Keywords
    III-V semiconductors; aluminium compounds; bulk acoustic wave devices; crystal resonators; elemental semiconductors; silicon; sputtered coatings; wide band gap semiconductors; Si-AlN; frequency 100 MHz; laterally-excited silicon bulk acoustic resonators; longitudinal piezoelectric stress coefficient; silicon resonator; suspended silicon microstructure; vertical sidewalls; Acoustics; Films; Resonant frequency; Sensors; Silicon; Stress; Surface treatment; Lateral excitation; SiBAR; bulk acoustic resonator; electromechanical coupling; longitudinal piezoelectric coefficient; motional resistance; sidewall AlN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969689
  • Filename
    5969689