DocumentCode :
2537919
Title :
Laterally-excited silicon bulk acoustic resonators with sidewall AlN
Author :
Tabrizian, R. ; Ayazi, F.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
1520
Lastpage :
1523
Abstract :
This paper presents lateral silicon bulk acoustic resonators that are piezoelectrically excited using a thin layer of AlN on their vertical sidewalls. Sputtered AlN coats the sidewalls of a 20 um thick resonator conformally and uniformly, enabling the excitation of width-extensional modes in a suspended silicon microstructure using the longitudinal piezoelectric stress coefficient e33. A motional resistance of ~35 Ω was measured in air for a 100 MHz silicon resonator, showing at least ten times smaller motional resistance compared to its capacitive counterpart.
Keywords :
III-V semiconductors; aluminium compounds; bulk acoustic wave devices; crystal resonators; elemental semiconductors; silicon; sputtered coatings; wide band gap semiconductors; Si-AlN; frequency 100 MHz; laterally-excited silicon bulk acoustic resonators; longitudinal piezoelectric stress coefficient; silicon resonator; suspended silicon microstructure; vertical sidewalls; Acoustics; Films; Resonant frequency; Sensors; Silicon; Stress; Surface treatment; Lateral excitation; SiBAR; bulk acoustic resonator; electromechanical coupling; longitudinal piezoelectric coefficient; motional resistance; sidewall AlN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969689
Filename :
5969689
Link To Document :
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