• DocumentCode
    2538014
  • Title

    A self-healing 2.4GHz LNA with on-chip S11/S21 measurement/calibration for in-situ PVT compensation

  • Author

    Jayaraman, Karthik ; Khan, Qadeer ; Chi, Baoyong ; Beattie, William ; Wang, ZhiHua ; Chiang, Patrick

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
  • fYear
    2010
  • fDate
    23-25 May 2010
  • Firstpage
    311
  • Lastpage
    314
  • Abstract
    This paper presents a 2.4GHz, reconfigurable RF LNA using on-chip peak detection and calibration to measure and optimize its input impedance (S11) and gain (S21) in-situ, compensating for the unpredictable effects of process, voltage and temperature (PVT) variations. Measurement results show that the calibration of the LNA across PVT corners improves the S11 by 5.1dB, S21 by 3dB, while not significantly degrading the Noise Figure (0.22dB degradation) and linearity (1.7dBm degradation).
  • Keywords
    low noise amplifiers; PVT compensation; frequency 2.4 GHz; input impedance; on-chip peak detection; process-voltage-and-temperature variation; reconfigurable RF LNA; Calibration; Degradation; Gain measurement; Impedance measurement; Linearity; Noise figure; Noise measurement; Radio frequency; Temperature; Voltage; LNA; PVT; on-chip calibration; peak detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-6240-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2010.5477307
  • Filename
    5477307
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2538014