Title :
Tracklet Association with Online Target-Specific Metric Learning
Author :
Bing Wang ; Gang Wang ; Kap Luk Chan ; Li Wang
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper presents a novel introduction of online target-specific metric learning in track fragment (tracklet) association by network flow optimization for long-term multi-person tracking. Different from other network flow formulation, each node in our network represents a tracklet, and each edge represents the likelihood of neighboring tracklets belonging to the same trajectory as measured by our proposed affinity score. In our method, target-specific similarity metrics are learned, which give rise to the appearance-based models used in the tracklet affinity estimation. Trajectory-based tracklets are refined by using the learned metrics to account for appearance consistency and to identify reliable tracklets. The metrics are then re-learned using reliable tracklets for computing tracklet affinity scores. Long-term trajectories are then obtained through network flow optimization. Occlusions and missed detections are handled by a trajectory completion step. Our method is effective for long-term tracking even when the targets are spatially close or completely occluded by others. We validate our proposed framework on several public datasets and show that it outperforms several state of art methods.
Keywords :
image fusion; learning (artificial intelligence); object tracking; optimisation; affinity score; appearance consistency; appearance-based models; long-term multiperson tracking; long-term trajectories; missed detection handling; network flow optimization; occlusions; online target-specific metric learning; public datasets; reliable tracklet identification; target-specific similarity metrics; track fragment; tracklet affinity estimation; tracklet association; trajectory completion; trajectory-based tracklets; Reliability; Target tracking; Training; Trajectory; Vectors;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
DOI :
10.1109/CVPR.2014.161