• DocumentCode
    2538180
  • Title

    New analysis methods of multilevel accelerated life tests

  • Author

    McLinn, James A.

  • Author_Institution
    Rel-Tech Group, Hanover, USA
  • fYear
    1999
  • fDate
    18 -21 Jan 1999
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    The development of multilevel accelerated life stress tests has been hindered by the difficulty of performing adequate and satisfactory data analysis. When 2, 3 or 4 levels of stress exist, even a computer analysis can be formidable. Nelson (1990) showed that even a simple analysis of seven levels of a single stress can become quite a challenge. This paper shows a new computerized software approach that has recently become available to the reliability engineer. It makes the analysis of multilevel stresses much easier. Complete or suspended data with 2 different stresses and multiple levels can now be analyzed employing the maximum likelihood estimator to achieve best fit solutions. In addition, confidence estimates can be made and the detailed stress-life relationship of the important parameters may be investigated. The data analysis solutions will permit the reliability person a wider latitude in selecting test stresses, methods and conditions when testing products in the future
  • Keywords
    data analysis; life testing; maximum likelihood estimation; reliability; analysis methods; best fit solutions; computerized software approach; maximum likelihood estimator; multilevel accelerated life stress tests; product testing; reliability engineer; Acceleration; Costs; Data analysis; Failure analysis; Life estimation; Life testing; Maximum likelihood estimation; Performance evaluation; Stress; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1999. Proceedings. Annual
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-5143-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1999.744094
  • Filename
    744094