Hierarchical test generation: Taking boundary scan to the next level

Development of the original IEEE 1149.1 boundary-scan standard in 1990 was motivated primarily by concerns about the complexity of testing increasingly dense printed-circuit board assemblies in manufacturing. As a result, most test generation efforts have been targeted at unit test, which is most applicable to testing MCMs and boards. As boundary-scan technology has matured, there is a new focus on extending the technique to testing all levels of an assembly´s hierarchy, at all phases in its life cycle