Title :
High power demonstration at 10 GHz with GaN-AlGaN HEMT hybrid amplifiers
Author :
Sheppard, S.T. ; Pribble, W.L. ; Enerson, D.T. ; Ring, Z. ; Smith, R.P. ; Allen, S.T. ; Palmour, J.W.
Author_Institution :
Cree Inc., Durham, NC, USA
Abstract :
The GaN/AlGaN-on-SiC HEMT is being pursued as an RF power device on which to base next generation X-band and K-band power amplifiers. Previous demonstrations of extremely high power density and total RF power from GaN/AlGaN HEMTs on SI SiC substrates (Sheppard et al., 1999; Wu et al., 1999) adequately demonstrate their potential for improved performance over GaAs-based devices. Considering the recent advances in III-nitride growth and processing techniques, it is not surprising that GaN/AlGaN HEMTs on SiC substrates are beginning to the reach the extremely high power levels that have been predicted for this material system. To continue this trend, we are pursuing high quality HEMT structures with 15% AlGaN molar fraction (MF) in order to fabricate large area devices and demonstrate high power levels. We report the demonstration of over 40 W from a single GaN/AlGaN transistor at 10 GHz under pulsed mode conditions. This high power demonstration includes the first implementation of SiC substrate vias on a GaN-on-SiC microwave transistor for improved gain at X-band.
Keywords :
HEMT integrated circuits; III-V semiconductors; aluminium compounds; gallium compounds; hybrid integrated circuits; integrated circuit measurement; microwave field effect transistors; microwave integrated circuits; microwave power amplifiers; power HEMT; wide band gap semiconductors; 10 GHz; 10.9 to 36 GHz; 40 W; 5.2 to 10.9 GHz; AlGaN molar fraction; GaN-AlGaN HEMT hybrid amplifiers; GaN-AlGaN-SiC; GaN-on-SiC microwave transistor; GaN/AlGaN HEMTs; GaN/AlGaN transistor; GaN/AlGaN-on-SiC HEMT; HEMT structures; III-nitride growth; K-band power amplifiers; RF power device; SI SiC substrates; SiC; SiC substrate vias; X-band gain; X-band power amplifiers; large area devices; power density; power levels; pulsed mode conditions; total RF power; Aluminum gallium nitride; Gallium nitride; HEMTs; K-band; Microwave devices; Microwave transistors; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Silicon carbide;
Conference_Titel :
Device Research Conference, 2000. Conference Digest. 58th DRC
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-6472-4
DOI :
10.1109/DRC.2000.877078