DocumentCode
2538805
Title
A new self-aligned top-gate polysilicon TFT architecture for low temperature processing
Author
Fulks, R.T. ; Ho, J. ; Boyce, J.B.
Author_Institution
Xerox Palo Alto Res. Center, CA, USA
fYear
2000
fDate
19-21 June 2000
Firstpage
103
Lastpage
104
Abstract
Summary form only given. Laser crystallized polysilicon thin film transistors (TFTs) have been found attractive for active matrix addressing with integrated drivers on low temperature glass substrates and more recently on plastic substrates. The TFT process typically uses a top gate self-aligned architecture with a laser crystallization channel anneal and a thermal doping activation anneal. For very low temperature processing, two laser anneal steps are required (Carey et al, 1997). In this work, we have developed a new self-aligned TFT architecture that requires only a single laser process step to achieve simultaneous crystallization and doping. It also has the advantage of allowing an efficient hydrogen passivation step early in the process.
Keywords
crystallisation; doping profiles; elemental semiconductors; laser beam annealing; passivation; semiconductor device measurement; silicon; thin film transistors; H/sub 2/; Si; TFT process; active matrix addressing; hydrogen passivation step; integrated drivers; laser anneal steps; laser crystallization channel anneal; laser crystallized polysilicon TFTs; laser crystallized polysilicon thin film transistors; low temperature glass substrates; low temperature processing; plastic substrates; self-aligned TFT architecture; self-aligned top-gate polysilicon TFT architecture; simultaneous crystallization/doping; single laser process step; thermal doping activation anneal; top gate self-aligned architecture; very low temperature processing; Active matrix addressing; Annealing; Crystallization; Doping; Driver circuits; Glass; Plastics; Substrates; Temperature; Thin film transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2000. Conference Digest. 58th DRC
Conference_Location
Denver, CO, USA
Print_ISBN
0-7803-6472-4
Type
conf
DOI
10.1109/DRC.2000.877107
Filename
877107
Link To Document