• DocumentCode
    2538891
  • Title

    A high power CMOS differential T/R switch using multi-section impedance transformation technique

  • Author

    Kim, Hyun-Woong ; Ahn, Minsik ; Lee, Ockgoo ; Lee, Chang-Ho ; Laskar, Joy

  • Author_Institution
    Georgia Electron. Design Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    23-25 May 2010
  • Firstpage
    483
  • Lastpage
    486
  • Abstract
    A high-power single-pole-double-throw (SPDT) antenna switch using a differential architecture and a multi-section impedance transformation technique is demonstrated in a standard 0.18-μm CMOS process. The differential architecture prevents unwanted channel formation of OFF-state Rx switch transistors by relieving the voltage swing over the Rx switch devices. In addition to this architecture, impedance transformation technique helps to reduce the voltage swing even more, contributing to significant enhancement of power handling capability. A loss of the whole design block including switch and matching networks has been analyzed, considering the integration issue of the front-end circuitries. The measured performance of the differential switch shows input 1-dB compression point (P1dB) of 33.8 dBm with insertion losses of 0.5 dB and 1.1 dB for Tx and Rx modes at 1.9 GHz, respectively.
  • Keywords
    CMOS integrated circuits; power semiconductor switches; OFF-state Rx switch transistors; differential architecture; high power CMOS differential; multi-section impedance transformation technique; power handling capability; single-pole-double-throw antenna switch; unwanted channel formation; voltage swing; CMOS process; CMOS technology; High power amplifiers; Impedance matching; Insertion loss; Performance loss; Radio frequency; Switches; Transceivers; Voltage; CMOS switch; differential switch; high-power switch; integration; multi-section impedance transformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-6240-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2010.5477353
  • Filename
    5477353