DocumentCode :
253899
Title :
Graph Cut Based Continuous Stereo Matching Using Locally Shared Labels
Author :
Taniai, Tatsunori ; Matsushita, Yuki ; Naemura, Takeshi
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
fYear :
2014
fDate :
23-28 June 2014
Firstpage :
1613
Lastpage :
1620
Abstract :
We present an accurate and efficient stereo matching method using locally shared labels, a new labeling scheme that enables spatial propagation in MRF inference using graph cuts. They give each pixel and region a set of candidate disparity labels, which are randomly initialized, spatially propagated, and refined for continuous disparity estimation. We cast the selection and propagation of locally-defined disparity labels as fusion-based energy minimization. The joint use of graph cuts and locally shared labels has advantages over previous approaches based on fusion moves or belief propagation, it produces submodular moves deriving a subproblem optimality, enables powerful randomized search, helps to find good smooth, locally planar disparity maps, which are reasonable for natural scenes, allows parallel computation of both unary and pairwise costs. Our method is evaluated using the Middlebury stereo benchmark and achieves first place in sub-pixel accuracy.
Keywords :
graph theory; image fusion; image matching; minimisation; natural scenes; random processes; stereo image processing; MRF inference; Middlebury stereo benchmark; belief propagation; candidate disparity labels; continuous disparity estimation; fusion moves; fusion-based energy minimization; graph cut based continuous stereo matching method; locally planar disparity maps; locally shared labels; locally-defined disparity label propagation; locally-defined disparity label selection; natural scenes; randomized search; spatial propagation; Accuracy; Benchmark testing; Graphics processing units; Labeling; Optimization; Proposals; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/CVPR.2014.209
Filename :
6909605
Link To Document :
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