• DocumentCode
    2539021
  • Title

    F-22 CATS application to the thermal cycling stress screen of self-testing, liquid flow-through LRMs

  • Author

    Nesson, R.

  • Author_Institution
    Hughes Aircraft Co., CA
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    429
  • Lastpage
    435
  • Abstract
    The application of the F-22 Common Automated Test Station (CATS) standards to the development of an effective thermal cycling stress screening (TCSS) system for the Line Replaceable Modules (LRMs) of the F-22 Common Integrated Processor (CIP) demonstrated the versatility of this COTS open architecture approach in the solution of this uncommon ATE requirement. The liquid flow-through cooling approach utilized by these modules negated the effectiveness of the most common TCSS approach in which the ambient air temperature within an enclosed test chamber is varied, and instead required the TCSS CATS station to manage the temperature profile of the module cooling liquid. The station was, of course, also required to provide the usual command and control of the test instrumentation while providing extensive management of the individual module test histories. The resulting system achieves high predicted screening effectiveness while allowing maximum manufacturing flexibility for six (6) module types in sixteen (16) individual test locations. The key to this flexibility is a unique backplane assembly which takes maximum advantage of the modules unusual ability to both test and fault isolate themselves
  • Keywords
    aircraft testing; automatic test equipment; automatic testing; cooling; modules; open systems; stress measurement; thermal stresses; Common Automated Test Station; Common Integrated Processor; F-22; Line Replaceable Modules; TCSS CATS station; ambient air temperature; enclosed test chamber; liquid flow-through LRM; manufacturing flexibility; module cooling liquid; module test histories; open architecture; screening effectiveness; self-testing; temperature profile; test instrumentation; thermal cycling stress screen; Automatic testing; Cats; Command and control systems; Cooling; History; Instruments; Standards development; System testing; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
  • Conference_Location
    Dayton, OH
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-3379-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1996.547736
  • Filename
    547736