DocumentCode :
2539198
Title :
Impacts of merit order based dispatch on transfer capability and static voltage stability
Author :
Nguyen, Cuong P. ; Flueck, Alexander J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL
fYear :
2008
fDate :
20-24 July 2008
Firstpage :
1
Lastpage :
6
Abstract :
In this paper, the goal is to investigate the impacts of generation merit order based dispatch on transfer capability and static voltage stability. The concept of generation merit order can be based on traditional costs or market bids. The new merit order feature has been incorporated into the existing Continuation Method Trace Tool (CMTRACE). More specifically, the well-known continuation power flow problem is reformulated to take into account the merit order effect of dispatching generators on the static P-V curve, given a power system operating point, a load demand forecast and a table of generation MW blocks and prices. The modeling difficulties in dealing with sequentially ordered generation block dispatches, such as exact transition point search and solution time, are efficiently solved. The numerical results on two case studies of a 3493-bus system show that the merit order of dispatching generation has significant impacts on the P-V curve and the simulation time.
Keywords :
load flow; load forecasting; power generation dispatch; power system stability; pricing; 3493-bus system; CMTRACE; continuation method trace tool; load demand forecast; merit order based dispatch generation; power flow; power system operating point; pricing; static P-V curve; voltage stability; Bifurcation; Dispatching; Load flow; Power generation; Power system control; Power system modeling; Power system simulation; Power system stability; Power systems; Voltage; Continuation power flow; distance to collapse; static bifurcation; voltage stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
Conference_Location :
Pittsburgh, PA
ISSN :
1932-5517
Print_ISBN :
978-1-4244-1905-0
Electronic_ISBN :
1932-5517
Type :
conf
DOI :
10.1109/PES.2008.4596518
Filename :
4596518
Link To Document :
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