Title :
A 90nm-CMOS, 500Mbps, fully-integrated IR-UWB transceiver using pulse injection-locking for receiver phase synchronization
Author :
Hu, Changhui ; Chiang, Patrick Y. ; Hu, Kangmin ; Liu, Huaping ; Khanna, Rahul ; Nejedlo, Jay
Author_Institution :
Oregon State Univ., Corvallis, OR, USA
Abstract :
A fully-integrated, 3.1-5 GHz Impulse-Radio UWB transceiver with on-chip flash ADC is designed in 90 nm-CMOS. A new scheme for receiver phase acquisition is proposed that uses pulse injection-locking to synchronize the receive clock with the transmitted data, eliminating the need for clock/data recovery (CDR). Occupying 2 mm2 die area, the transceiver achieves a maximum data rate of 500 Mbps, energy efficiency of 0.18 nJ/b at 500 Mbps, and a RX-BER of 10-3 across a distance of 10 cm at 125 Mbps.
Keywords :
CMOS integrated circuits; analogue-digital conversion; error statistics; synchronisation; transceivers; ultra wideband communication; BER; CDR; CMOS; bit rate 125 Mbit/s; bit rate 500 Mbit/s; clock/data recovery; frequency 3.1 GHz to 5 GHz; fully-integrated IR-UWB transceiver; impulse-radio UWB transceiver; on-chip flash ADC; pulse injection-locking; receiver phase acquisition; receiver phase synchronization; size 90 nm; Analog-digital conversion; Bandwidth; Clocks; Frequency synchronization; Local oscillators; Radio transmitters; Receivers; Sampling methods; Transceivers; Voltage-controlled oscillators; Impulse radio (IR); UWB; equalization; injection-locking; transceiver;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6240-7
DOI :
10.1109/RFIC.2010.5477371