DocumentCode :
2539273
Title :
SPR photo diode detector using transportation phenomenon of photon and electron coupling
Author :
Ajiki, Yoshiharu ; Kan, Tetsuo ; Matsumoto, Kiyoshi ; Shimoyama, Isao
Author_Institution :
Future Creation Lab., Olympus Corp., Tokyo, Japan
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
1915
Lastpage :
1918
Abstract :
We propose a Surface Plasmon Resonance (SPR) photodiode (PD) detector using transportation phenomenon of photon and electron coupling. Since SPR is usually measured by reflection intensity, a large space for measuring the intensity is required. Thus, we develop an SPR detector, which can detect an SPR condition without measuring the reflection intensity as shown in Figure 1(a). In this paper, we show that an SPR can be measured by using the sensor. And we verified the SPR transportation phenomenon of photon and electron coupling from experimental results.
Keywords :
photodetectors; photodiodes; surface plasmon resonance; SPR photodiode detector; electron coupling transportation phenomenon; photon coupling transportation phenomenon; surface plasmon resonance photodiode detector; Couplings; Films; Gold; Gratings; Optical surface waves; Reflection; Surface waves; Photo diode; Photon and electron coupling; Suface Plasmon Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969760
Filename :
5969760
Link To Document :
بازگشت