DocumentCode :
2539317
Title :
An all-digital offset PLL architecture
Author :
Staszewski, Robert Bogdan ; Vemulapalli, Sudheer ; Waheed, Khurram
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
2010
fDate :
23-25 May 2010
Firstpage :
17
Lastpage :
20
Abstract :
We propose an all-digital offset PLL architecture in which the RF oscillator output is frequency translated through rotation of its quadrature phases before being fed back for the phase comparison with the frequency reference. This eliminates spurious tones caused by the finite resolution of the phase detection process when the synthesized frequency is very close to the integer-N multiple of the reference frequency. The phase detection in the ADPLL is performed by a time-to-digital converter (TDC), whose typical resolution of 10-30 ps is sufficient for the GSM-quality RF operation. While the TDC quantization noise does not normally produce significant phase noise degradation, the near-integer-N condition makes the loop ill-behaved such that the total quantization energy falls close to dc and will not get filtered by the loop filter. In addition, due to the frequency relationship change between aggressors and victims, an important class of spurs due to parasitic coupling is also eliminated. The hardware overhead is very small and the digital implementation does not degrade other RF parameters. The technique is validated in a 65-nm CMOS transceiver.
Keywords :
CMOS integrated circuits; convertors; oscillators; phase locked loops; phase noise; CMOS transceiver; RF oscillator output; all-digital offset PLL architecture; near-integer-N condition; phase detection process; phase noise degradation; size 65 nm; time-to-digital converter; Degradation; Energy resolution; Filters; Frequency synthesizers; Oscillators; Phase detection; Phase locked loops; Phase noise; Quantization; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-6240-7
Type :
conf
DOI :
10.1109/RFIC.2010.5477376
Filename :
5477376
Link To Document :
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